Field Emission Scanning Electron Microscope with Focused Ion Beam (FIB) : Electron Microscopy Service : UPV

Field Emission Scanning Electron Microscope with Focused Ion Beam (FIB)

Electron Microscopy Service Fichas Field Emission Scanning Electron Microscope with Focused Ion Beam (FIB) ...

Field Emission Scanning Electron Microscope with Focused Ion Beam (FIB)

TECHNIQUES:		MANUFACTURER:
COMPANY:	ZEISS	MODEL:	AURIGA Compact

Dual Beam: Focused Ion Beam and FESEM X-Ray Detector (EDS) Electron Backscatter Difraction (EBSD)		ZEISS ORSAY PHYSICS KLEINDIEK OXFORD INSTRUMENTS