X-ray detector (EDS): receives X-rays from each point on the surface scanned by the electron beam. As the energy of each X-ray is characteristic for each element, it offers qualitative and quantitative analytical information on areas of the size desired on the surface. For this reason, this technique is known as EDS Microanalysis.

The JEM-1400Flash includes the EDS detector from Oxford Instruments, Ultim Max TEM windowless model, with an area of 80 mm2 and the complete software for the elemental analysis of the samples: spectra, maps, lines and creation of results reports.