The transmission electron microscope (TEM) uses the physical and atomic phenomena produced when a sufficiently accelerated electron beam collides with a suitably prepared thin sample. When the electrons collide with a sample, depending on its thickness and the type of atoms in the sample, some of them disperse selectively, i.e., there is a gradation between the electrons that pass through it directly and those that are fully diverted. They are all driven and modulated by lenses that form a final image on a CCD that can be magnified thousands of times with a definition that is unattainable for any other instrument. The information obtained is an image with different intensities of grey corresponding to the level of dispersion of the incident electrons.

The TEM image described offers information on the sample structure, whether amorphous or crystalline.

Furthermore, if the sample is crystalline -in other words, there is a periodic plane structure- various families of these planes may meet the Bragg condition and coherently diffract the incident electron wave. The result is a diffraction diagram, which is an image of different points ordered with respect to a central point (non-deviated transmitted electrons); this offers information on the orientation and structure of the crystal/crystals present.

The JEM-1400Flash is a TEM specially designed for the study of material samples. Its emission source is a thermionic cathode with LaB6 filament and the accelerating voltage has a range of 10 to 120 kV. The pole piece chosen is the high resolution (HR) one. The resolution of this equipment is 0.14 nm between lines in TEM mode.

The JEM-1400Flash is equipped with a camera with a high sensitivity CMOS sensor and very low noise signal level, integrated into the microscope's own control software. Its resolution is 2k x 2K, with a pixel size of 21.7 x 21.7 microns and a 16-bit dynamic range with an acquisition speed of 30 fps at maximum resolution. It also includes a drift correction system in the acquisition of the images.

The JEM-1400Flash includes the STEM detector for bright field and dark field image acquisition. Its resolution is 1.5 nm. at 120 kV.

The JEM-1400Flash includes the EDS detector from Oxford Instruments, Ultim Max TEM windowless model, with an area of 80 mm2 and the complete software for the elemental analysis of the samples: spectra, maps, lines and creation of results reports.